IEEE Home | Shop IEEE | Join IEEE | myIEEE | Contact IEEE | IEEEXplore
IEEE
21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2013)
 

Thank you for your support in IPFA 2014. Photo Gallery

See you next year at IPFA 2015!

WELCOME TO IPFA 2014 WEBSITE!

The 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2014) is organized by the IEEE Reliability/CPMT/ED Singapore Chapter. The Symposium is technically co-sponsored by the IEEE Electron Device Society and IEEE Reliability Society.

IPFA 2014 is devoted to the fundamental understanding of the physical mechanisms of semiconductor device failures and issues related to semiconductor device reliability, yield and performance, especially those related to advanced process technologies.


2014 Best Poster Winner- FA

Electrical and Physical Analysis of a 28nm FPGA programmable delay circuit single tap delay Failure
G. Tan, J. Ou Yang, H. Haonan and Y. M. Chow
Xilinx Asia Pacific, Singapore


2014 Best Poster Winner- Reliability

Junction induced Variation and Reliability for Ultra-Thin-Body and Bulk Oxide CMOSFETs
W. K. Yeh1, P. Y. Chen2 and C. L. Lin3
1National University of Kaohsiung, Taiwan; 2I-Shou University, Taiwan; 3Feng Chia University, Taiwan


Art of FA Photo Contest

1st Prize: Birdie in the hole Lew Li Lian,
FA Snr. Tech., GLOBALFOUNDRIES, Singapore

2nd Prize: Hibiscus Khoo Bingsheng,
WinTech Nano-Technology Services Pte. Ltd, Singapore

3rd Prize: Loving birds on a tree branch Muhamad Hilmi Rosnan,
FA Tech., Semiconductor Malaysia

  White Christmas Chng Kheaw Chung,
FA Engineer, System on Silicon Manufacturing Company, Singapore

 
Platinum Sponsor
 
Silver Sponsor
 
 


 
sponsors
 
Copyright © 2013 IPFA2014. All rights reserved.